Heidenhain’s TS 760 touch probe offers 3D accuracy to within 1 µm and homogeneous switching behavior over 360 degrees. The company says the probe’s 1 m/min feed rate is four times faster than other products offering repeatability equal to or within 0.25 µm at two standard deviations.
The touch probe’s low, ≈0.2 N of trigger force and ≈1.5 N of axial force limit form and surface damage to fragile parts. Users can also clean the probing point with an integrated flusher feature that uses compressed air and cooling lubricant of up to 60 bars. Functionally, the probe is fully compatible with the TS 740 and provides the same additional data as the TS 460.
An SE 661 transceiver with an EnDat communication signal sends collected data over radio or infrared channels to Heidenhain’s contouring TNC or other major CNC controls.
